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Entwicklung eines Mess- und Auswerteverfahrens zur röntgenographischen Analyse des Eigenspannungszustandes im Oberflächenbereich vielkristalliner Werkstoffe

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Author: Search for this author Genzel, Christoph
Year: 1999
Publisher: Berlin, HMI
Media group: Ausleihbestand
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Branch: Hauptstelle Locations: PH-10 10 Status: available Reservations: 0 Due date: Barcode: 00135941 Floor plans: Floor plan Lending note:

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Author: Search for this author Genzel, Christoph
Statement of Responsibility: Christoph Genzel
Year: 1999
Publisher: Berlin, HMI
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Classification: Search for this systematic PH-10
Subject type: Search for this subject type Dissertationen
Description: XIII, 232 S. : graph. Darst.
Tags: Physik allgemein
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Footnote: Zugl.: Berlin, Humboldt Univ., Habil., 1999
Media group: Ausleihbestand